Journal of Research of the National Institute of Standards and Technology
AbstractHigh-accuracy transmission measurements at an optical wavelength of 633 nm and mechanical measurements of the thickness of a 13-µ-m thick silicon-crystal film have been used to calculate the absorption and extinction coefficients of silicon at 633 nm. The results are 3105 +/- 62 cm-1 and 0.01564 +/- 0.00031, respectively. These results are about 15% less than current handbook data for the same quantities, but are in good agreement with a recent fit to one set of data described in the literature.
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